Stop Hunting, Start Solving: Accelerating Root Cause Analysis with Agentic AI

IEEE Spectrum's AI section is hosting a free webinar titled "Stop Hunting, Start Solving: Accelerating Root Cause Analysis with Agentic AI." The session is framed around turning yield excursions into faster, more confident root cause analysis.

The webinar's premise is that when a yield issue emerges, the answer rarely lives in a single system. Critical clues are described as spread across metrology data, tool traces, chemical analysis, and facilities systems, while growing data volumes make traditional dashboards slow, fragmented, and difficult to act on.

Stated learning objectives include discovering how a purpose-built semiconductor analytics platform can help engineers connect insights across domains without moving data. The session also promises to show how Agentic AI, semiconductor-specific visualizations, and push-down compute enable faster investigation of yield excursions and process issues, including across billions of data points.

A live demonstration is planned, showing how to conduct a multi-domain root cause investigation using Spotfire Industry Pro.

Listed key takeaways are: understanding why siloed manufacturing data delays yield recovery and inflates costs; learning how Agentic AI automates complex cross-domain analytics and visualization generation; and exploring methods for scaling high-performance analytics across massive fab datasets.

The target audience is yield, process, and integration engineers; fab and manufacturing operations managers; quality and reliability engineers; and data and analytics leaders supporting wafer fabs, foundries, OSATs, and IDMs who need to identify issues faster while maintaining confidence in decision-making.

Registration for the webinar is free. No date, time, or named speakers were included in the announcement.